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物理学及応用物理学専攻

個別データ

 分類学会発表
 開催年月2011/05
 学会名Atomic Level Characterizations for New Materials and Devices ’11
 開催都市ソウル・Korea
 タイトルSpot Profiles of Transmission Electron Diffraction Patterns Measured with Low-energy Scanning Electron Microscopy
 発表者・連名者 Yukiko Miyakoshi, K. Fukase, N. Chiyoda, G. Odahara and C. Oshima
 講演番号26PS15
 概要To analyze single-molecular structures composed of light elements with electron microscope, we are trying to observe diffraction patterns from low-energy electron beam and to get information on detailed profiles of the diffraction spots with high wave-vector resolution and high signal-to-noise ratio. In this work, we developed the apparatus equipped with SPA-LEED optics to measure the spots profile of the low-energy transmission electron diffraction (LETED); a single detector of a channeltron detects angular distributions of elastic electrons in reciprocal space, and hence the same sensitivity was realized for all the electrons transmitted in the different directions. As a result, we succeeded in obtaining LETED patterns, which exhibited the detailed spots and the intensity distribution around them. The only spot you want to notice could be profiled. As a preparatory phase of the aim, molecular structure analysis, we acquired LETED patterns of the self-standing graphene membranes which expected as sample holding bases.
 指導教員大島 忠平